Penvenan, France

Alain Mugnier

This inventor holds 1 USPTO granted patent. Top assignee: Exfo Optics, Sas. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alain Mugnier. Retrieved from https://idiyas.com/inventor/alain-mugnier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Alain Mugnier and His Patent for a Tunable Laser

Introduction

Alain Mugnier is an inventor associated with Penvenan, France, and Exfo Optics SAS. His recorded patent work includes 1 patent concerning tunable laser technology.

Latest Patents

Mugnier’s patent, “Tunable Laser Having Low Intra-Cavity Chromatic Aberrations,” describes a tunable external-cavity laser and a laser source based on that design. The laser uses two reflective surfaces to form a cavity, an active waveguide to amplify light, and a wavelength-selective filter to choose the emission wavelength within a tuning range.

The design also uses an imaging lens and a collimating lens system to direct the optical beam. The imaging lens introduces positive chromatic aberration, while a complex collimating lens introduces negative chromatic aberration to at least partially compensate for it. This approach is intended to reduce intra-cavity chromatic aberrations as the laser’s wavelength is tuned.

Career Highlights

Mugnier’s documented patent contribution focuses on optical engineering and tunable laser design. The patent identifies Exfo Optics SAS as his company affiliation.

Collaborations

The available information connects Mugnier’s patent work with Exfo Optics SAS. No additional collaborators are specified in the provided details.

Conclusion

Alain Mugnier’s recorded invention addresses chromatic aberration in tunable external-cavity lasers through a lens system designed to counterbalance optical dispersion across the tuning range.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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