San Jose, CA, United States of America

Akshay Patil

This inventor holds 1 USPTO granted patent. Top assignee: Aidash, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akshay Patil. Retrieved from https://idiyas.com/inventor/akshay-patil-1s3217bm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Akshay Patil and Hazard-Tree Identification

Introduction

Akshay Patil is an inventor based in San Jose, California, and is associated with AIDash, Inc. His patent work addresses the identification of trees that may pose risks to electrical assets in power distribution infrastructure.

Latest Patents

Patil is named on one patent, “Systems and Methods for Identifying Hazard Trees.” The invention describes a method that uses convolutional neural networks to classify pixels in images of a geographic area as hazard-tree or non-hazard-tree pixels. It then generates polygons corresponding to potential hazard trees, determines their height and distance from electrical assets, and assesses whether they may pose a hazard. When a potential risk is identified, the system generates and provides a notification. Patil’s reported patent count is 1 patent.

Career Highlights

The available information connects Patil’s patent activity with AIDash, Inc. His invention applies image analysis and machine learning to help identify potential tree-related risks to power distribution infrastructure.

Collaborations

Pranav Prakash and Ankur Saxena are identified as Patil’s coworkers. The available information does not specify their roles in the patent or the invention.

Conclusion

Akshay Patil’s patent describes an image-based approach to identifying hazard trees near electrical assets, with the goal of helping infrastructure operators detect and communicate potential risks.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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