This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: International Business Machines Corporation. Active years: 1998.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1998
Title: Akram Aref Bou-Ghannam: Innovator in Interferometric Imaging
Introduction
Akram Aref Bou-Ghannam is a notable inventor based in Boca Raton, FL (US). He has made significant contributions to the field of interferometric imaging, particularly in the detection and analysis of defects in test surfaces. His innovative approach has led to the development of a unique patent that enhances the accuracy and efficiency of defect detection.
Latest Patents
Akram holds a patent for an "Apparatus and method for storing interferometric images of scanned." This invention utilizes an interferometer to locate and examine defects in a test surface of a test specimen. The process involves driving the test surface past the objective of the interferometer at a constant speed while examining a darkfield interferogram. The location of each defect is stored during this examination. Subsequently, the test specimen is moved to specific locations for static measurements using an area array of CCD elements. The phase angle relationship of the interferometer is varied to calculate the heights of surface segments, ensuring accurate height corrections for segments located beyond a quarter wavelength of the interferometer light source.
Career Highlights
Akram is associated with the International Business Machines Corporation (IBM), where he applies his expertise in interferometric imaging. His work has contributed to advancements in the field, showcasing his commitment to innovation and technology.
Collaborations
Throughout his career, Akram has collaborated with notable colleagues, including Alan David Dorundo and Michael G Lisanke. These collaborations have further enriched his work and contributed to the development of cutting-edge technologies.
Conclusion
Akram Aref Bou-Ghannam is a distinguished inventor whose work in interferometric imaging has made a significant impact in the field. His innovative patent and contributions to IBM highlight his dedication to advancing technology and improving defect detection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
