Otawara, Japan

Akiyosi Kinda

This inventor holds 1 USPTO granted patent. Top assignees: Kabushiki Toshiba, Toshiba Medical Systems Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akiyosi Kinda. Retrieved from https://idiyas.com/inventor/akiyosi-kinda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Akiyosi Kinda: Innovator in Radiodiagnostic Technology

Introduction

Akiyosi Kinda is a notable inventor based in Otawara, Japan. He has made significant contributions to the field of radiodiagnostic technology, particularly through his innovative patent.

Latest Patents

Kinda holds a patent for a radiodiagnostic apparatus. This apparatus includes a data collection unit, a primary correction unit, a body contour detection unit, a secondary correction unit, and a reconstruction unit. The primary correction unit is designed to calculate multiple primary extrapolation expression candidates for correcting second projection data. This process aims to obtain third projection data candidates formed from the second projection data and the primary extrapolation expression candidates.

Career Highlights

Throughout his career, Akiyosi Kinda has worked with prominent companies such as Toshiba and Toshiba Medical Systems Corporation. His experience in these organizations has allowed him to develop and refine his expertise in medical technology.

Collaborations

Kinda has collaborated with notable professionals in his field, including Nobutoku Motomura. Their partnership has contributed to advancements in radiodiagnostic systems.

Conclusion

Akiyosi Kinda's work in radiodiagnostic technology exemplifies innovation and dedication to improving medical imaging. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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