Osaka, Japan

Akira Shingu

This inventor holds 6 USPTO granted patents and 1 EPO patent. Top assignee: Toyo Aluminium Kabushiki Kaisha. Active years: 2012-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Shingu. Retrieved from https://idiyas.com/inventor/akira-shingu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 83.3


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012-2024

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6 patents (USPTO):Explore Patents

Title: Akira Shingu: Innovator in Aluminum Alloy Technology

Introduction

Akira Shingu is a prominent inventor based in Osaka, Japan, known for his significant contributions to the field of aluminum alloy technology. With a total of six patents to his name, Shingu has made remarkable advancements in the production and application of aluminum materials.

Latest Patents

Shingu's latest patents include innovative developments in aluminum alloy foil and laminates. One of his notable inventions is an aluminum alloy foil that comprises aluminum, silicon, manganese, iron, zinc, copper, and magnesium. This foil is characterized by a total content of silicon and iron that is less than or equal to 0.1 mass percent. Additionally, the ratio of manganese to the total mass of silicon and iron is maintained at a minimum of 7.0. The first surface of this foil features an area ratio of second phase particles, each with an equivalent circle diameter of more than or equal to 1.5 μm, that is less than or equal to 0.1%.

Another significant patent involves aluminum foil designed for ultraviolet light reflecting materials. This invention specifies that the ratio of the total surface area of aluminum particles pressed into or adhering to a predetermined surface area is less than or equal to 0.05%. Furthermore, the total surface area of crystallized products present in the same region is limited to less than or equal to 2% of the surface area

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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