Company Filing History:
Years Active: 1995
Title: Akira Odagiri: Innovator in Refractive Index Measurement
Introduction
Akira Odagiri is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of optical measurement, particularly in the area of refractive index measurement of thin films. His innovative approach has implications for various applications in optics and materials science.
Latest Patents
Odagiri holds a patent for a method of measuring the refractive index of thin films. This method involves forming a dielectric thin film on two substrates with different refractive indexes and measuring their reflectivities using light of an identical wavelength. The process allows for accurate determination of the refractive index of the dielectric thin film, which is crucial for various optical applications.
Career Highlights
Odagiri is associated with Shincron Co., Ltd., where he has been able to apply his expertise in optical measurement. His work has contributed to advancements in the field, enhancing the understanding and measurement of optical properties in materials.
Collaborations
Some of his coworkers include Shinichiro Saisho and Toshinobu Ikeda, who have collaborated with him on various projects related to optical measurement and thin film technology.
Conclusion
Akira Odagiri's contributions to the field of refractive index measurement demonstrate his innovative spirit and dedication to advancing optical science. His work continues to influence the industry and inspire future innovations.