Tokyo, Japan

Akira Hamaguchi

This inventor holds 2 USPTO granted patents and 4 published patent applications. Top assignee: Hitachi High-Tech Corporation. Active years: 2022-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Hamaguchi. Retrieved from https://idiyas.com/inventor/akira-hamaguchi-79x8ixuk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 5.5

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022-2023

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2 patents (USPTO):Explore Patents

Title: Akira Hamaguchi: Innovator in Electron Microscopy

Introduction

Akira Hamaguchi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electron microscopy, holding 2 patents that showcase his innovative approach to technology. His work has implications for various applications in materials science and engineering.

Latest Patents

Hamaguchi's latest patents include a scanning electron microscopy system and a pattern depth measurement method. The scanning electron microscopy system features a primary electron beam radiation unit that irradiates a first pattern on a substrate, which has a second pattern in its peripheral region. This system includes a detection unit that captures back scattered electrons emitted from the substrate, an image generation unit that creates an electron beam image based on the strength of these electrons, and a processing unit that estimates the depth of the first pattern.

Another notable patent is an electron microscope apparatus that detects reflected electrons from a sample when irradiated with primary electrons. This apparatus generates an image of the sample's surface and processes it to measure the dimensions of patterns formed on the sample. These innovations reflect Hamaguchi's expertise in enhancing the capabilities of electron microscopy.

Career Highlights

Hamaguchi is currently employed at Hitachi High-Tech Corporation, where he continues to develop advanced technologies in electron microscopy. His work has positioned him as a key figure in the field, contributing to the advancement of imaging techniques that are crucial for research and industrial applications.

Collaborations

Throughout his career, Hamaguchi has collaborated with talented individuals such as Takahiro Nishihata and Mayuka Osaki. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Akira Hamaguchi's contributions to electron microscopy through his patents and work at Hitachi High-Tech Corporation highlight his role as an influential inventor. His advancements in technology continue to impact the field significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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