Tokyo, Japan

Akira Genma

This inventor holds 1 USPTO granted patent. Top assignee: Yamaichi Electronics Co., Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Genma. Retrieved from https://idiyas.com/inventor/akira-genma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Akira Genma: Innovator in Kelvin Contact Technology

Introduction

Akira Genma is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative designs in Kelvin contacts. His work has implications for the efficiency and accuracy of inspections in integrated circuit (IC) devices.

Latest Patents

Genma holds a patent for a Kelvin contact for inspection, which includes a Kelvin socket and a method of manufacturing the Kelvin contact. This invention addresses the common issue of contact misalignment during repeated Kelvin inspections. The design features a first contact that interfaces with an electrode terminal of an IC device and a second contact that also connects to the same terminal, ensuring stability and reliability in inspections.

Career Highlights

Genma is associated with Yamaichi Electronics Co., Ltd., where he has been instrumental in advancing inspection technologies. His patent reflects his commitment to improving the precision of electronic component testing. With a total of 1 patent, he has established himself as a key figure in his field.

Collaborations

Throughout his career, Genma has worked alongside talented colleagues such as Katsumi Suzuki and Tsuyoshi Matsumoto. Their collaborative efforts have contributed to the development of innovative solutions in the electronics industry.

Conclusion

Akira Genma's contributions to Kelvin contact technology exemplify the importance of innovation in the field of electronic inspections. His work continues to influence the industry, ensuring more reliable testing methods for IC devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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