Tokyo, Japan

Akio Hagiya

This inventor holds 1 USPTO granted patent. Top assignee: Fuji Electric Co., Ltd.. Active years: 1983.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akio Hagiya. Retrieved from https://idiyas.com/inventor/akio-hagiya-7cgs442i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 1983

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1 patent (USPTO):Explore Patents

Title: Akio Hagiya and His Ultrasonic Measuring Device.

Introduction

Akio Hagiya is an inventor associated with Tokyo, Japan, and Fuji Electric Co., Ltd. His listed patent concerns measuring fluid flow in conduits carrying high-temperature fluids.

Latest Patents

Hagiya is credited with 1 patent, titled “Ultrasonic Measuring Device.” The invention uses ultrasonic transducers mounted on two frames that hinge together at one end and can be secured around a conduit at the other. Lead wires run through hollow pipes to connecting terminals, with optional heat-radiating fins at the pipes’ outward ends. This arrangement helps keep the terminals near room temperature, allowing ordinary coaxial cables to be connected while the device measures high-temperature fluid flow.

Career Highlights

Hagiya’s listed invention addresses the practical challenge of using ultrasonic measurement equipment around hot conduits. Its frame, wiring, and heat-management features are designed to support installation and reliable connections in those conditions.

Collaborations

The provided information names Kiyoshi Saito and Akira Kikuchi as Hagiya’s coworkers. It does not specify their roles in developing or patenting the ultrasonic measuring device.

Conclusion

Akio Hagiya’s recorded patent reflects an engineering approach to measuring high-temperature fluid flow while protecting electrical connections from heat.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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