Musashino, Japan

Akihiro Ooshima

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Yokogawa Electric Corporation. Active years: 2015-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akihiro Ooshima. Retrieved from https://idiyas.com/inventor/akihiro-ooshima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015-2016

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2 patents (USPTO):Explore Patents

Title: Akihiro Ooshima: Innovator in Physical Quantity Measurement

Introduction

Akihiro Ooshima is a notable inventor based in Musashino, Japan. He has made significant contributions to the field of physical quantity measurement, holding a total of 2 patents. His work focuses on innovative methods and apparatuses that enhance measurement accuracy and efficiency.

Latest Patents

Ooshima's latest patents include a physical quantity measuring apparatus and a physical quantity measuring method. The method involves generating a synchronized input signal from an input signal, measuring the total number of pulses of a reference clock, and calculating the average number of pulses based on various parameters. This innovative approach aims to improve the precision of physical measurements.

Career Highlights

Ooshima is currently employed at Yokogawa Electric Corporation, where he continues to develop cutting-edge technologies in measurement systems. His expertise in this area has positioned him as a key player in advancing measurement techniques.

Collaborations

Throughout his career, Ooshima has collaborated with esteemed colleagues such as Hideki Fujiwara and Tomotaka Morikawa. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Akihiro Ooshima's contributions to the field of physical quantity measurement exemplify his dedication to innovation. His patents and collaborative efforts continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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