Yokohama, Japan

Akihiro Musha

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akihiro Musha. Retrieved from https://idiyas.com/inventor/akihiro-musha-bs265a28

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Akihiro Musha: Innovator in Image Sensing Technology

Introduction

Akihiro Musha is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of image sensing technology. His innovative work focuses on enhancing the stability and reliability of image sensors under various lighting conditions.

Latest Patents

Musha holds a patent for an image sensing device designed to detect flicker under fluorescent lamp illumination. The invention utilizes an XY-addressed-scanning type image sensor. It integrates video signals per frame period and compares integrated values to identify flicker patterns. This technology effectively determines the existence of flicker when identical patterns are observed consecutively.

Career Highlights

Akihiro Musha is associated with Hitachi, Ltd., a leading company in technology and innovation. His work at Hitachi has allowed him to develop cutting-edge solutions in image sensing. Musha's dedication to research and development has positioned him as a key figure in his field.

Collaborations

Musha has collaborated with notable colleagues, including Satoshi Nidaira and Teruo Hoshi. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Akihiro Musha's contributions to image sensing technology exemplify his commitment to advancing the field. His innovative patent addresses critical challenges in image detection, showcasing his expertise and dedication to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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