Aichi, Japan

Akihiko Onchi


Average Co-Inventor Count = 3.0

ph-index = 5

Forward Citations = 49(Granted Patents)


Company Filing History:


Years Active: 2005-2007

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11 patents (USPTO):Explore Patents

Title: Akihiko Onchi: Innovator in Connector Technology

Introduction

Akihiko Onchi is a prominent inventor based in Aichi, Japan, known for his significant contributions to connector technology. With a total of 11 patents to his name, Onchi has made remarkable advancements in the design and functionality of locking mechanisms in connectors.

Latest Patents

Onchi's latest patents include innovative designs for a lock structure and a connector with a lock mechanism. The first patent describes a connector featuring a lock mechanism that comprises a lock arm on the outer surface of a plug frame. This design includes a pair of supports that protrude from the plug frame, allowing the lock arm to swing around torque rods, facilitating a secure connection with a receptacle. The second patent focuses on reducing maximum stress at the hinge joint of the lock arm, enhancing the durability and reliability of the connector. This design ensures that the lock arm is effectively latched onto a receptacle, maintaining a stable connection.

Career Highlights

Onchi is currently employed at J.S.T. MFG. Co., Ltd., where he continues to innovate and develop new technologies in the field of connectors. His work has significantly impacted the industry, leading to more efficient and reliable products.

Collaborations

Throughout his career, Onchi has collaborated with notable coworkers, including Kazuomi Shimizu and Daisuke Miyachi. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Akihiko Onchi's contributions to connector technology through his innovative patents and collaborative efforts highlight his role as a leading inventor in the field. His work continues to influence the design and functionality of connectors, ensuring enhanced performance and reliability in various applications.

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