Tallinn, Estonia

Aivar Liimets

This inventor holds 1 USPTO granted patent. Top assignees: Ou Eliko Tehnoloogia Arenduskeskus, Tallinn University of Technology. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aivar Liimets. Retrieved from https://idiyas.com/inventor/aivar-liimets

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Aivar Liimets: Innovator in RFID Technology

Introduction

Aivar Liimets is a notable inventor based in Tallinn, Estonia. He has made significant contributions to the field of radio-frequency identification (RFID) technology. His innovative approach to synchronization methods has garnered attention in the tech community.

Latest Patents

Liimets holds a patent for a "Method and device for synchronization of a decoder of a RFID receiver." This patent describes a method for synchronizing an RFID receiver by receiving an input signal from an RFID tag. The process involves creating reference waveforms, calculating correlation values, and adjusting synchronization timebase based on phase inaccuracies. This invention enhances the efficiency and accuracy of RFID systems.

Career Highlights

Throughout his career, Aivar Liimets has worked with esteemed institutions such as Tallinn University of Technology and Ou Eliko Tehnoloogia Arenduskeskus. His work in these organizations has allowed him to develop and refine his innovative ideas in RFID technology.

Collaborations

Liimets has collaborated with notable colleagues, including Olev Martens and Alar Kuusik. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Aivar Liimets is a prominent figure in the field of RFID technology, with a patent that showcases his innovative spirit. His contributions continue to influence the development of synchronization methods in RFID systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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