Espoo, Finland

Aimo Heinonen

This inventor holds 1 USPTO granted patent. Top assignee: Conrex Automation Oy. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aimo Heinonen. Retrieved from https://idiyas.com/inventor/aimo-heinonen-g4clw8me

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Aimo Heinonen: Innovator in Reflectometric Measurements

Introduction

Aimo Heinonen is a notable inventor based in Espoo, Finland. He has made significant contributions to the field of measurement technology, particularly through his innovative designs and patents. His work focuses on enhancing the accuracy and efficiency of reflectometric measurements.

Latest Patents

Aimo Heinonen holds a patent for a measuring instrument specifically designed for reflectometric measurements. This invention showcases his expertise in developing tools that improve measurement precision in various applications. The patent reflects his commitment to advancing technology in this specialized area.

Career Highlights

Heinonen is currently associated with Conrex Automation Oy, a company known for its innovative solutions in automation and measurement technologies. His role at Conrex Automation Oy allows him to apply his inventive skills and contribute to the company's mission of delivering high-quality measurement instruments.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Aimo Heinonen's contributions to the field of reflectometric measurements highlight his innovative spirit and dedication to advancing measurement technology. His patent and work at Conrex Automation Oy exemplify the impact of his inventions in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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