Changchun, China

Aimi Wen

This inventor holds 1 USPTO granted patent. Top assignee: Jilin Zhong Ying High Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aimi Wen. Retrieved from https://idiyas.com/inventor/aimi-wen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Aimi Wen and a Temperature Measurement Invention.

Introduction

Aimi Wen is an inventor associated with Changchun, China, and Jilin Zhong Ying High Technology Co., Ltd. Her patent work includes a method and apparatus for measuring an object’s surface temperature.

Latest Patents

Wen is credited with 1 patent, titled “Method and Apparatus for Measuring Surface Temperature of an Object.” The invention uses temperature readings taken at the current moment and an earlier moment after a sensor has been in conductive contact with the object’s surface for a set duration. It determines a temperature compensation factor from those readings, applies correction factors, and calculates the surface temperature. The disclosed approach aims to measure temperature accurately without damaging the object.

Career Highlights

Wen’s listed invention focuses on contact-based temperature measurement and compensation. Her association with Jilin Zhong Ying High Technology Co., Ltd. connects her patent work with a technology company based in China.

Collaborations

The available information identifies Jilin Zhong Ying High Technology Co., Ltd. as Wen’s company affiliation. It does not specify additional collaborators or research partners.

Conclusion

Aimi Wen’s patent describes a compensated temperature-measurement method designed to provide accurate surface readings while preserving the measured object.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…