Haifa, Israel

Afik Shoham

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Uster Technologies Ag. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Afik Shoham. Retrieved from https://idiyas.com/inventor/afik-shoham-25s86yz8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: The Innovations of Afik Shoham

Introduction

Afik Shoham is a notable inventor based in Haifa, Israel. He has made significant contributions to the field of technology, particularly with his innovative ideas and inventions. His work has garnered attention in the industry, showcasing his expertise and creativity.

Latest Patents

Afik Shoham holds a patent for a fabric-monitoring device. This invention demonstrates his ability to merge technology with practical applications, providing solutions that enhance the functionality of fabric products. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Afik Shoham is currently employed at Uster Technologies AG, a company known for its advancements in textile quality control. His role at Uster Technologies AG allows him to further develop his ideas and contribute to the company's mission of improving textile manufacturing processes.

Collaborations

Afik has worked alongside talented colleagues, including Ingo Kiefer and Shmuel Cohen. Their collaborative efforts have likely enriched his work and led to innovative solutions in their projects.

Conclusion

Afik Shoham is an accomplished inventor whose work in fabric-monitoring technology exemplifies his innovative spirit. His contributions to Uster Technologies AG and collaborations with skilled professionals highlight his impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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