Maple Ridge, Canada

Adolph John Vandermaar

This inventor holds 1 USPTO granted patent. Top assignee: Powertech Labs Inc.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Adolph John Vandermaar. Retrieved from https://idiyas.com/inventor/adolph-john-vandermaar

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Adolph John Vandermaar: Innovator in Transformer Technology

Introduction

Adolph John Vandermaar is a notable inventor based in Maple Ridge, Canada. He has made significant contributions to the field of transformer technology, particularly in the area of winding movement detection.

Latest Patents

Vandermaar holds a patent for "Transformer winding movement detection by high frequency internal response analysis." This innovative approach involves placing an input sensor inside the transformer on an input winding lead and an output sensor on an output winding lead. This method overcomes the frequency limitations of previous external measurement techniques, allowing for useful measurements at much higher frequencies, specifically up to 20 MHz.

Career Highlights

Vandermaar is associated with Powertech Labs Inc., where he applies his expertise in electrical engineering and transformer technology. His work has been instrumental in advancing the capabilities of transformer monitoring and diagnostics.

Collaborations

One of his notable coworkers is Meng-Guang Wang, with whom he has likely collaborated on various projects within the company.

Conclusion

Adolph John Vandermaar's contributions to transformer technology through his innovative patent demonstrate his commitment to advancing electrical engineering. His work continues to influence the industry and improve transformer performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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