Company Filing History:
Years Active: 2013
Title: Adi Costa - Innovator in Semiconductor Metrology
Introduction
Adi Costa is a notable inventor based in Kfar Sava, Israel. He has made significant contributions to the field of semiconductor metrology, particularly through his innovative patent. His work focuses on improving the classification of structural elements in semiconductor manufacturing processes.
Latest Patents
Adi Costa holds a patent for a "CD metrology system and method of classifying similar structural elements." This patent outlines a method that includes obtaining an image of the semiconductor structure, identifying structural elements from different manufacturing stages, and assessing features indicative of their respective stages. The results of this assessment are used for classification decisions related to manufacturing stages.
Career Highlights
Adi Costa is currently employed at Applied Materials Israel Limited, where he applies his expertise in semiconductor technology. His innovative approach has led to advancements in the efficiency and accuracy of semiconductor manufacturing processes.
Collaborations
Adi collaborates with Yan Ivanchenko, a talented coworker who contributes to their shared goals in the field of semiconductor metrology.
Conclusion
Adi Costa's work exemplifies the importance of innovation in semiconductor technology. His contributions through his patent and collaboration with colleagues continue to shape the future of the industry.