Beechhurst, NY, United States of America

Adeline W Jahelka

This inventor holds 1 USPTO granted patent. Top assignee: The Narda Microwave Corp.. Active years: 1981.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Adeline W Jahelka. Retrieved from https://idiyas.com/inventor/adeline-w-jahelka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1981

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1 patent (USPTO):Explore Patents

Title: Adeline W. Jahelka: Innovator in High Frequency Probes

Introduction

Adeline W. Jahelka is a notable inventor based in Beechhurst, NY (US). She has made significant contributions to the field of microwave technology, particularly with her innovative work on high frequency probes. Her dedication to advancing technology is evident through her patent and professional endeavors.

Latest Patents

Adeline holds one patent for her invention of a high frequency probe. This invention showcases her expertise and commitment to enhancing microwave technology, which is crucial for various applications in telecommunications and electronics.

Career Highlights

Adeline is currently employed at Narda Microwave Corporation, where she continues to develop and refine technologies that impact the industry. Her role at the company allows her to collaborate with other talented professionals and contribute to groundbreaking advancements in microwave engineering.

Collaborations

Adeline has worked alongside her coworker, Edward E. Aslan, to further her research and development efforts. Their collaboration exemplifies the importance of teamwork in driving innovation and achieving technological breakthroughs.

Conclusion

Adeline W. Jahelka is a pioneering inventor whose work in high frequency probes has made a lasting impact on the field of microwave technology. Her contributions continue to inspire future innovations in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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