Atlanta, GA, United States of America

Abul Raheem Beyah

This inventor holds 1 USPTO granted patent. Top assignee: Georgia Tech Research Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Abul Raheem Beyah. Retrieved from https://idiyas.com/inventor/abul-raheem-beyah

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Abul Raheem Beyah: Innovator in Cyber-Physical Systems

Introduction

Abul Raheem Beyah is a prominent inventor based in Atlanta, GA. He has made significant contributions to the field of cyber-physical systems through his innovative work. His expertise lies in device fingerprinting, which plays a crucial role in identifying devices within a network.

Latest Patents

Beyah holds a patent for a device fingerprinting technology specifically designed for cyber-physical systems. This patent, which is titled "Device fingerprinting for cyber-physical systems," discloses various embodiments for identifying devices that are part of a network. The technology models devices based on their physical characteristics, allowing for effective classification and verification of device communications. He has 1 patent to his name.

Career Highlights

Abul Raheem Beyah is affiliated with the Georgia Tech Research Corporation, where he continues to advance research in his field. His work has garnered attention for its potential applications in enhancing security and efficiency in networked systems.

Collaborations

Beyah collaborates with notable colleagues, including David Formby and Preethi Srinivasan, who contribute to his research endeavors.

Conclusion

Abul Raheem Beyah is a key figure in the development of innovative technologies for cyber-physical systems. His contributions through patenting and collaboration highlight his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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