Poughkeepsie, NY, United States of America

Abuchi Obiegbu

USPTO Granted Patents = 1 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Abuchi Obiegbu: Innovator in Workload Pattern Detection

Introduction

Abuchi Obiegbu is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of computer science, particularly in the area of workload pattern detection. His innovative approach has led to the development of a patented technology that enhances the security and efficiency of computer systems.

Latest Patents

Abuchi Obiegbu holds a patent for a computer-implemented method, computer program product, and computer system designed for workload pattern detection. This invention involves a processor that retrieves instructions for a plurality of processes. The processor generates a sample of these instructions and determines the probability that the sample includes instructions from malicious processes. If the probability exceeds a certain threshold, the processor restricts one or more aspects of operation for at least one process among the plurality of processes. This patent showcases his commitment to improving cybersecurity measures in computing environments. He has 1 patent to his name.

Career Highlights

Abuchi Obiegbu is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM allows him to collaborate with some of the brightest minds in the industry, contributing to cutting-edge technological advancements.

Collaborations

Some of his notable coworkers include Loic Fura and Chon N Lei. Their collaborative efforts in various projects have further enhanced the innovative environment at IBM.

Conclusion

Abuchi Obiegbu's contributions to workload pattern detection exemplify the importance of innovation in technology. His work not only addresses current challenges in cybersecurity but also paves the way for future advancements in the field.

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