This inventor holds 1 USPTO granted patent. Top assignee: United States of America as Represented by the Administrator of NASA. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014
Title: Abhinav Saxena and His Work on Remaining Useful Life Prediction.
Introduction
Abhinav Saxena is an inventor associated with Mountain View, California. His patent work addresses methods for estimating the remaining useful life of components and subsystems, a challenge relevant to monitoring equipment health and anticipating failure.
Latest Patents
Saxena is associated with 1 patent: “Decomposition Technique for Remaining Useful Life Prediction.” The invention divides remaining useful life estimation into two regression problems: mapping measured features to damage, and mapping operating conditions to the rate of damage. These mappings are first developed offline using measurements, operating conditions, and ground-truth information.
During online operation, sensor measurements and operating conditions are applied with the previously generated mappings to estimate the current damage state and forecast future damage. The remaining useful life is then calculated from the predicted time at which damage reaches a failure threshold. By separating the estimation into distinct mappings, the technique also supports explicit assessment and management of uncertainty.
Career Highlights
Saxena’s listed patent is associated with the United States of America as Represented by the Administrator of NASA. The invention reflects an application of regression-based modeling to equipment prognostics and maintenance planning.
Collaborations
Saxena’s listed coworkers include Kai F. Goebel and Jose R. Celaya. Their names are associated with the collaborative research context of his patent work.
Conclusion
Abhinav Saxena’s patent describes a structured approach to predicting equipment life by estimating present damage, forecasting its accumulation, and accounting for uncertainty.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile