Clifton Park, NY, United States of America

Abdulrahman Al-khalidy

This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Abdulrahman Al-khalidy. Retrieved from https://idiyas.com/inventor/abdulrahman-al-khalidy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Abdulrahman Al-khalidy: Imaging Innovation Through Spiral-Scan Tomosynthesis.

Introduction

Abdulrahman Al-khalidy is an inventor associated with Clifton Park, New York, and General Electric Company. His patent work addresses three-dimensional X-ray imaging and improved depth resolution in tomosynthesis.

Latest Patents

The provided information lists one patent for Al-khalidy: “Method and System for Imaging a Volume Using a Three-Dimensional Spiral Scan Trajectory.” The invention uses a spiral path for an X-ray source to collect projection data at positions offset in the direction perpendicular to the detector. Combining data from different positions along that direction can produce three-dimensional tomosynthesis images with improved depth resolution. The listed patent count is 1 patent.

Career Highlights

Al-khalidy’s listed patent reflects work on imaging methods that use three-dimensional scan trajectories to improve the detail available in tomosynthesis images. The supplied information associates him with General Electric Company.

Collaborations

The listed coworkers are Jeffrey Wayne Eberhard and Abdalmajeid Musa Alyassin. Their inclusion indicates professional associations in the information provided, though specific collaborative roles are not stated.

Conclusion

Abdulrahman Al-khalidy’s documented invention applies a three-dimensional spiral scan trajectory to improve depth resolution in tomosynthesis, highlighting his contribution to X-ray imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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