This inventor holds 2 USPTO granted patents. Top assignee: North American Philips Corporation. Active years: 1976-1985.
Company Filing History:
Years Active: 1976-1985
Title: Innovations by Aaron Blaustein
Introduction
Aaron Blaustein is an accomplished inventor based in Oyster Bay, NY (US). He has made significant contributions to the field of X-ray inspection systems, holding a total of 2 patents. His work focuses on enhancing the efficiency and effectiveness of digital imaging technologies.
Latest Patents
One of Blaustein's latest patents is for an "Intrinsic object sensing in a digital fan beam X-ray inspection system." This invention provides a digital system that includes circuitry for imaging items passing on a conveyor belt through an X-ray fan beam. The circuitry enables the detection of items as soon as the X-ray beam is pierced, maintaining an image of the items on a monitor even after their removal from the X-ray beam. This innovation allows for the detection of all items entering the X-ray beam and facilitates subsequent inspection.
Another notable patent is the "Article transfer and inspection apparatus." This apparatus comprises chamber-defining means that are substantially impermeable to X-rays, along with an X-ray source for directing X-rays to a specific portion of the chamber. The system includes feed and extraction conveyor systems that serve to introduce and remove articles from the chamber. The inspection conveyor system operates at a speed equal to or greater than the feed conveyor system, carrying the article through the chamber while converting X-rays passing through the article into a visual image. The apparatus also features means for achieving predetermined spacing between various articles.
Career Highlights
Aaron Blaustein has made a significant impact in his field while working at North American Philips Corporation. His innovative designs and patents have contributed to advancements in X-ray technology and inspection systems.
Collaborations
Blaustein has collaborated with notable colleagues, including David J. Haas and Chester D. Rudd. Their combined expertise has furthered the development of innovative solutions in the realm of X-ray inspection.
Conclusion
Aaron Blaustein's contributions to the field of X-ray inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in imaging systems, paving the way for future advancements in the industry.