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USPTO Data Jan 1 1976 - Oct 20 2026
37 Patents
#5 in Le Locle
#381 in Switzerland
#18,299 in the World
Zenith International S.a.
Forward Citations = 545
6 inventors:
Zenith International S.a.
% Expired Patents = 5.4
Trademarks = 3
Forward Citations = 545
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6 inventors (with patents filed for the assignee):
Thierry Nataf (28 out of 29 patents)
Janik Filiberti (4 out of 4 patents)
Laurent Besse (3 out of 6 patents)
4. Jean-Pierre Charpier (1 out of 4 patents)
5. Christian Taillard (1 out of 5 patents)
6. Pierre Vincent (1 out of 1 patent)
Core Competencies:
Watch Dial
Tourbillon
Watch Case
Date Indicator
Jumping Seconds
Timepiece
Surface Ornamentation
Oscillating Weight
Wristwatch
Front Face
Time Display
Mechanical Timepiece
37 patents:
Company Overview
Zenith International S.a., based in Le Locle, Switzerland, specializes in the development and manufacturing of high-precision timekeeping instruments and related technologies. The company is renowned for its expertise in horology, focusing on innovative designs and advanced engineering techniques that enhance the performance and reliability of timepieces. With a commitment to quality and craftsmanship, Zenith International serves a global market, contributing to the evolution of watchmaking through research and technological advancements.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Zenith International S.a.. Retrieved from https://idiyas.com/company/zenith-international-s-a
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]