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For the Inventor, By the Inventor

KR

Yulim Hitech, Inc.


USPTO Granted Patents = 2

Forward Citations = 168

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2 inventors (with patents filed for the assignee):

goldMedal Soo Jung Yoon (1 out of 2 patents)

silverMedal Tae-Un Jun (1 out of 1 patent)


2 patents:

1. 7014499 - Probe card for testing semiconductor device (2006-03-21),
2. 6922069 - Needle assembly of probe card (2005-07-26),
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USPTO Data Jan 1 1976 - Dec 30 2025

2 Patents

#228 in

#3,610 in South Korea

...
KR

Yulim Hitech, Inc.

Forward Citations = 168

2 inventors:

goldMedal Soo Jung Yoon (1 out of 2 patents)

silverMedal Tae-Un Jun (1 out of 1 patent)

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