Eede, Netherlands

Xeikon IP B.v.


USPTO Granted Patents = 21

% Expired Patents = 66.7



Forward Citations = 11

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28 inventors (with patents filed for the assignee):

goldMedal Lode Erik Dries Deprez (9 out of 23 patents)

silverMedal Werner Jozef Johan Op De Beeck (7 out of 16 patents)

bronzeMedal Wim Libaers (4 out of 4 patents)

4.  Nick Horemans (3 out of 4 patents)

5.  Romain Jan Victor Paul Van Der Gucht (2 out of 6 patents)

6.  Jurgen Norbert Bart Devlieghere (2 out of 4 patents)

7.  Geert Gaston Paul Deroover (2 out of 7 patents)

8.  Mathias Jo Bert Van Remortel (2 out of 2 patents)

9.  Dirk Marcel Constant Gijsbrechts (2 out of 2 patents)

10.  Marc Lodewijk Cornelia Goetschalckx (2 out of 3 patents)

11.  Jürgen Norbert Bart Devlieghere (2 out of 3 patents)

12.  Stefan Eggers (2 out of 7 patents)

13.  John Hedde (1 out of 2 patents)

14.  Herman Jan Godelieve Van De Straete (1 out of 5 patents)

15.  Bjorn Leynen (1 out of 2 patents)


21 patents:

Company Overview
Xeikon IP B.V., headquartered in Eede, Netherlands, specializes in digital printing technology and solutions. The company focuses on developing innovative printing systems and software that cater to various industries, including labels, packaging, and commercial printing. Xeikon is known for its commitment to high-quality, sustainable printing processes, leveraging advanced technologies such as inkjet and electrophotography. The organization plays a significant role in enhancing the efficiency and versatility of digital printing applications globally.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

Xeikon IP B.v. USPTO Patent Assignee Logo
21 Patents

#1 in Eede

#345 in Netherlands

#29,961 in the World

Eede, NL
Eede, Netherlands
Forward Citations = 11

28 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Xeikon IP B.v.. Retrieved from https://idiyas.com/company/xeikon-ip-b-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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