Forward Citations = 49

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5 inventors (with patents filed for the assignee):

Gregory E Johnston (5 out of 14 patents)

James O Bowlby, Jr (2 out of 9 patents)

Robert E Malm (2 out of 25 patents)

4. Byron D Wagner (2 out of 2 patents)

5. Lloyd Hes (2 out of 2 patents)

6 patents: Sort by Forward Citations

1. 5381245 - X-ray film scanning and digitizing apparatus (1995-01-10),

2. 5343308 - Extended dynamic range image digitizing apparatus (1994-08-30),

3. 5283426 - Methods and apparatus for obtaining nonlinear responses from (1994-02-01),

4. 5268567 - Charge collection control circuit for use with charge-coupled (1993-12-07),

5. 5241406 - X-ray film scanning and digitizing apparatus (1993-08-31),

6. 5218485 - Expanded dynamic range image digitizing apparatus (1993-06-08),

Company Overview

X-ray Scanner Corporation specializes in producing cutting-edge x-ray scanning technology for security and industrial applications. With a team of experienced engineers and technicians, we provide innovative solutions to help businesses enhance their security measures and optimize their operations. Our products are designed to deliver high-quality images with exceptional accuracy and efficiency, ensuring reliable detection of potential threats or anomalies. Visit our website to learn more about our advanced x-ray scanning systems and services.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#101 in Torrance, CA

#10,578 in California

#45,007 in US

Torrance, CA, United States of America

X-Ray Scanner Corporation

Forward Citations = 49

5 inventors:

Gregory E Johnston (5 out of 14 patents)

James O Bowlby, Jr (2 out of 9 patents)

Robert E Malm (2 out of 25 patents)

4. Byron D Wagner (2 out of 2 patents)

5. Lloyd Hes (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: X-Ray Scanner Corporation. Retrieved from https://idiyas.com/company/x-ray-scanner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]