% Expired Patents = 14.3

Forward Citations = 360

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5 inventors (with patents filed for the assignee):

David C Nemir (7 out of 19 patents)

Stanley Simon Hirsh (4 out of 10 patents)

Edward S Rubio (2 out of 9 patents)

4. Jan Bastian Beck (2 out of 3 patents)

5. Stanley S Hirshi (1 out of 1 patent)

7 patents: Sort by Forward Citations

1. 7635284 - Programmable appliance controller (2009-12-22),

2. 7366622 - Arc fault identification using model reference estimation (2008-04-29),

3. 7221106 - Cordset based appliance controller (2007-05-22),

4. 6843766 - Fecal incontinence management device (2005-01-18),

5. 6700333 - Two-wire appliance power controller (2004-03-02),

6. 6560079 - Ground loss detection for electrical appliances (2003-05-06),

7. 6262871 - Fail safe fault interrupter (2001-07-17),

Company Overview

X-l Synergy is a leading technology solutions provider, specializing in cutting-edge software development, data analytics, and IT consulting services. With a diverse team of experts and a track record of delivering innovative solutions, X-l Synergy helps businesses optimize their operations, improve efficiency, and drive growth. Their commitment to excellence and customer satisfaction sets them apart in the industry.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

7 Patents

#4 in El Paso, TX

#2,556 in Texas

#39,929 in US

El Paso, TX, United States of America

X-L Synergy

Forward Citations = 360

5 inventors:

David C Nemir (7 out of 19 patents)

Stanley Simon Hirsh (4 out of 10 patents)

Edward S Rubio (2 out of 9 patents)

4. Jan Bastian Beck (2 out of 3 patents)

5. Stanley S Hirshi (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: X-L Synergy. Retrieved from https://idiyas.com/company/x-l-synergy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]