Company Badge
USPTO Data Jan 1 1976 - Nov 3 2026
8 Patents
#73 in Dayton, OH
#1,439 in Ohio
#35,984 in US
Woolpert, Inc.
Forward Citations = 4
16 inventors:
Dayton, OH, United States of America
Woolpert, Inc.
Calculating rank
CIPO Patents = 1
Trademarks = 15
Forward Citations = 4
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16 inventors (with patents filed for the assignee):
Daniel K Ngoroi (5 out of 5 patents)
Nathan Lee Hopper (3 out of 3 patents)
Joseph R Seppi (3 out of 3 patents)
4. Rodney Ross Faulkner, Ii (3 out of 3 patents)
5. Mark Douglas Smits, Ii (3 out of 3 patents)
6. Mark Stephen Millman (3 out of 3 patents)
7. Eric Josef Cahoon (3 out of 3 patents)
8. Joshua Gluckman (3 out of 3 patents)
9. Alexander Cheff Halterman (3 out of 3 patents)
10. Grady Tuell (3 out of 3 patents)
11. Andrew Wallace Stark (3 out of 3 patents)
12. John Henry Gerhard (3 out of 3 patents)
13. William Jeffrey Lillycrop (3 out of 3 patents)
14. Christopher T Cotton (3 out of 24 patents)
15. Joong Yong Park (2 out of 2 patents)
8 patents:
Company Overview
Woolpert, Inc. is a leading architecture, engineering and geospatial (AEG) firm delivering value to clients by strategically blending engineering excellence with innovative technology and geospatial applications. With a focus on connecting people, processes and technology, Woolpert provides a wide range of consulting services in disciplines such as aviation, defense, energy, infrastructure, water resources and more.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Woolpert, Inc.. Retrieved from https://idiyas.com/company/woolpert
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]