% Expired Patents = 25.0

Forward Citations = 21

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9 inventors (with patents filed for the assignee):

Scott Grant (4 out of 8 patents)

Todd Henry (4 out of 5 patents)

Sean Davoren (4 out of 5 patents)

4. Bob Johnston (3 out of 4 patents)

5. David Whitehouse (2 out of 3 patents)

6. Dave Whitehouse (2 out of 2 patents)

7. David N West (1 out of 2 patents)

8. Thomas Harrison Lupfer (1 out of 9 patents)

9. Robert Johnston (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 8528822 - Hand-held data collector with detachable scanner (2013-09-10),

2. D660297 - Combined hand-held data collector base and detachable scanner (2012-05-22),

3. D646282 - Hand-held data collector with removable scanner (2011-10-04),

4. D633501 - Hand-held data collector with removable scanner (2011-03-01),

Company Overview

WIS International is a leading global inventory and data collection services company, providing physical and electronic inventory services to a wide range of industries including retail, healthcare, and manufacturing. With over 65 years of experience, WIS International offers accurate and efficient inventory solutions to help businesses streamline their operations and improve profitability.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

4 Patents

#157 in Mississauga

#3,460 in Canada

Mississauga, Canada

Wis International

Forward Citations = 21

9 inventors:

Scott Grant (4 out of 8 patents)

Todd Henry (4 out of 5 patents)

Sean Davoren (4 out of 5 patents)

4. Bob Johnston (3 out of 4 patents)

5. David Whitehouse (2 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Wis International. Retrieved from https://idiyas.com/company/wis-international

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]