Greenville, SC, United States of America

Wangner Systems Corporation


USPTO Granted Patents = 39

Forward Citations = 1,076

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16 inventors (with patents filed for the assignee):

goldMedal Scott David Quigley (12 out of 59 patents)

silverMedal Volker Ostermayer (8 out of 10 patents)

bronzeMedal Richard W Smith (7 out of 8 patents)

4.  Chien-Yeh Hsu (6 out of 6 patents)

5.  Thomas B Fleischer (5 out of 6 patents)

6.  Hermann Gaisser (3 out of 3 patents)

7.  John D Tyler (1 out of 1 patent)

8.  Chien-Yen Hsu (1 out of 1 patent)

9.  Vaughn M Renwick (1 out of 1 patent)

10.  Michael D Praetzel (1 out of 1 patent)

11.  John S Turner (1 out of 1 patent)

12.  Gilles F Duquette (1 out of 1 patent)

13.  William R Martin (1 out of 1 patent)

14.  Samuel E Shank (1 out of 1 patent)

15.  Roger L Banks (1 out of 1 patent)


Core Competencies:
Papermaking Fabric
Multi-Layer Fabric
Low Permeability
Dryer Fabric
Weft Dominated
Controlled Porosity
Laser Tracking
Abrasion Resistant
Woven Fabric
Embossing Fabric
Textile Technology
Forming Fabric

39 patents:

Company Overview
Wangner Systems Corporation, based in Greenville, SC, specializes in advanced automation and control systems. The company focuses on developing innovative solutions for various industries, including manufacturing and logistics, enhancing operational efficiency and productivity. With a commitment to research and development, Wangner Systems is dedicated to integrating cutting-edge technology into their products, ensuring they meet the evolving needs of their clients in a competitive landscape.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

39 Patents

#10 in Greenville, SC

#58 in South Carolina

#8,830 in US

#17,465 in the World

Greenville, SC (US)
Greenville, SC, United States of America
Forward Citations = 1,076

16 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Wangner Systems Corporation. Retrieved from https://idiyas.com/company/wangner-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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