CIPO Patents = 1

EPO Patents = 4

Forward Citations = 20

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9 inventors (with patents filed for the assignee):

Philip Teague (2 out of 21 patents)

Alex Stewart (2 out of 9 patents)

Phil Teague (2 out of 5 patents)

4. Reinhart Ciglenec (1 out of 35 patents)

5. Ådne Voll (1 out of 4 patents)

6. Max Spencer (1 out of 1 patent)

7. Dominik Szlezak (1 out of 1 patent)

8. Einar Ramstad (2 patents)

9. Phil Teague (0 patent)

10. Philip Teague (0 patent)

11. Robert Sloan (0 patent)

5 patents: Sort by Forward Citations

1. 12607766 - Detecting anomalies in annular materials of single and dual casing string environments (2026-04-21),

2. 12554038 - Methods and means for simultaneous casing integrity evaluation and cement inspection in a multiple-casing wellbore environment (2026-02-17),

3. 10012054 - Downhole logging tool cooling device (2018-07-03),

4. 8481919 - Apparatus and method for controllable downhole production of ionizing radiation without the use of radioactive chemical isotopes (2013-07-09),

5. 8466412 - Apparatus for registration of photons and ionizing particles with simultaneous directional definition, for each photon or ionizing particle, of a point of origin in a fluid-filled conduit (2013-06-18),

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

5 Patents

#326 in

#24 in Malta

MT

Visuray Technology Ltd.

Forward Citations = 20

9 inventors:

Philip Teague (2 out of 21 patents)

Alex Stewart (2 out of 9 patents)

Phil Teague (2 out of 5 patents)

4. Reinhart Ciglenec (1 out of 35 patents)

5. Ådne Voll (1 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Visuray Technology Ltd.. Retrieved from https://idiyas.com/company/visuray-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

4 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]