% Expired Patents = 20.0

EPO Patents = 2

Trademarks = 4

Forward Citations = 8

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4 inventors (with patents filed for the assignee):

Thomas P Kieffer (5 out of 7 patents)

Robert Barry Watson (5 out of 8 patents)

Rebecca L Showalter (1 out of 1 patent)

4. James I Hardy (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 11592377 - Fatigue life sensor for measuring repetitive loads applied to a structure based upon cracks propagating from crack initiation features of the sensor (2023-02-28),

2. 10247619 - Resistance temperature detector with medium temperature coefficient and high linearity (2019-04-02),

3. 9933321 - High gage factor strain gage (2018-04-03),

4. 9797789 - Strain gages with discrete electrical resistance trimming (2017-10-24),

5. 7094061 - Printed circuit board with integral strain gage (2006-08-22),

Company Overview

Vishay Measurements Group, Inc. is a leading manufacturer of sensors and measurement equipment for a wide range of applications including industrial, automotive, and medical. With a strong focus on quality and precision, the company offers a comprehensive portfolio of products such as strain gauges, transducers, and load cells. Vishay Measurements Group is known for its innovative solutions and reliable performance, making them a trusted partner for customers worldwide.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

5 Patents

#2 in Wendell, NC

#1,124 in North Carolina

#51,644 in US

Wendell, NC, United States of America

Vishay Measurements Group, Inc.

Forward Citations = 8

4 inventors:

Thomas P Kieffer (5 out of 7 patents)

Robert Barry Watson (5 out of 8 patents)

Rebecca L Showalter (1 out of 1 patent)

4. James I Hardy (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Vishay Measurements Group, Inc.. Retrieved from https://idiyas.com/company/vishay-measurements-group

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]