Southfield, MI, United States of America

Veoneer US Safety Systems, LLC


USPTO Granted Patents = 8


Forward Citations = 0

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15 inventors (with patents filed for the assignee):

goldMedal Demetri Stilianos (2 out of 5 patents)

silverMedal Luis Fernando Sanchez (2 out of 12 patents)

bronzeMedal Ron Wantuck (2 out of 3 patents)

4.  James Gramenos (2 out of 2 patents)

5.  John Fitzpatrick (2 out of 2 patents)

6.  Haitham Islim (2 out of 3 patents)

7.  Jacob Jay Yoder (1 out of 4 patents)

8.  Vincent Colarossi (1 out of 22 patents)

9.  Joshua Forwerck (1 out of 17 patents)

10.  David Eiswerth (1 out of 1 patent)

11.  Carl Munch (1 out of 2 patents)

12.  Stuart Koch (1 out of 1 patent)

13.  Nick Hunt (1 out of 1 patent)

14.  Michael Campbell (1 out of 1 patent)

15.  Grant Scott (1 out of 1 patent)


8 patents:

Company Overview
Veoneer US Safety Systems, LLC specializes in advanced safety systems and technologies for the automotive industry. As a leader in the field, the company focuses on providing innovative solutions that enhance vehicle safety and driver assistance. Their offerings include sensor technology, advanced driver assistance systems (ADAS), and software solutions designed to help manufacturers meet evolving safety standards. Veoneer's commitment to research and development ensures that they remain at the forefront of safety innovation, working closely with automakers to create safer roads and vehicles for everyone.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

8 Patents

#35 in Southfield, MI

#1,236 in Michigan

#35,924 in US

Southfield, MI (US)
Southfield, MI, United States of America
Forward Citations = 0

15 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Veoneer US Safety Systems, LLC. Retrieved from https://idiyas.com/company/veoneer-us-safety-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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