Emporia, KS, United States of America

Vektek, Inc.


USPTO Granted Patents = 23

% Expired Patents = 13.0


Trademarks = 4

Forward Citations = 155

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15 inventors (with patents filed for the assignee):

goldMedal Aaron Vernon Luthi (6 out of 6 patents)

silverMedal Roger L Craft (6 out of 7 patents)

bronzeMedal James V Mascola (6 out of 6 patents)

4.  Michael Dean Swan (3 out of 3 patents)

5.  Gregory Allen Yotz (3 out of 5 patents)

6.  Frederick A Hausler, Iii (3 out of 4 patents)

7.  Tyler Wayne Anliker (2 out of 2 patents)

8.  Nick J Karras (2 out of 2 patents)

9.  Larry Fish (2 out of 2 patents)

10.  Claude Ashley Huffman (1 out of 1 patent)

11.  Daniel Lee Goentzel (1 out of 1 patent)

12.  David M Smith (1 out of 1 patent)

13.  John H VanDalsem (1 out of 1 patent)

14.  David P Brisco (1 out of 1 patent)

15.  Joseph L Gray (1 out of 8 patents)


23 patents:

Company Overview
Vektek, Inc. is a prominent manufacturer based in Emporia, Kansas, specializing in innovative solutions for workholding and automation. The company focuses on developing high-quality products that enhance efficiency and precision in manufacturing processes. Vektek's expertise spans various domains, including hydraulic and pneumatic systems, offering a wide range of clamps, fixtures, and accessories tailored to meet the diverse needs of industries such as automotive, aerospace, and general manufacturing. Their commitment to quality and innovation positions them as a key player in the workholding sector.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

Vektek, Inc. USPTO Patent Assignee Logo
23 Patents

#3 in Emporia, KS

#94 in Kansas

#14,428 in US

#27,685 in the World

Emporia, KS (US)
Emporia, KS, United States of America
Forward Citations = 155

15 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Vektek, Inc.. Retrieved from https://idiyas.com/company/vektek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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