Hsinchu, Taiwan

Vastview Technology Inc.

Calculating rank
USPTO Granted Patents = 38

% Expired Patents = 73.7


Forward Citations = 147

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26 inventors (with patents filed for the assignee):

goldMedal Yuh-Ren Shen (20 out of 28 patents)

silverMedal Yuhren Shen (13 out of 19 patents)

bronzeMedal Hung-Chi Chu (12 out of 12 patents)

4.  Cheng-Jung Chen (11 out of 13 patents)

5.  Chang-Cheng Lin (6 out of 8 patents)

6.  Cheng-Chung Peng (5 out of 9 patents)

7.  Chun-Chi Chen (3 out of 7 patents)

8.  Yu-Lin Lee (3 out of 8 patents)

9.  Liang-Chen Chien (3 out of 4 patents)

10.  Hsin-Ta Lee (2 out of 3 patents)

11.  Ming-Chia Wang (2 out of 2 patents)

12.  Cheng Chung Peng (1 out of 1 patent)

13.  Yi-Fan Chen (1 out of 19 patents)

14.  Han-Jon Ho (1 out of 1 patent)

15.  Chih-Hao Wu (1 out of 3 patents)


Core Competencies:
LED Driving Circuit
Liquid Crystal Display
High Voltage
Image Quality Adjustment
Color Correction
Dynamic Backlight Control
Overdrive Method
Temperature Compensation

38 patents:

Company Overview
Vastview Technology Inc. is a prominent player in the field of advanced imaging and visualization technologies, headquartered in Hsinchu, Taiwan. The company specializes in developing innovative solutions that enhance visual data processing and analysis, catering to various industries including healthcare, automotive, and manufacturing. With a strong focus on research and development, Vastview aims to push the boundaries of imaging technology, providing cutting-edge tools that improve efficiency and decision-making in complex environments.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

38 Patents

#112 in Hsinchu

#504 in Taiwan

#17,860 in the World

Hsinchu, TW
Hsinchu, Taiwan
Forward Citations = 147

26 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Vastview Technology Inc.. Retrieved from https://idiyas.com/company/vastview-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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