Louisville, CO, United States of America

Vaisala, Inc.


USPTO Granted Patents = 14

% Expired Patents = 21.4


Trademarks = 10

Forward Citations = 48

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21 inventors (with patents filed for the assignee):

goldMedal Ryan K Said (4 out of 4 patents)

silverMedal Martin J Murphy (4 out of 4 patents)

bronzeMedal Evan Ruzanski (4 out of 4 patents)

4.  Niels LaWhite (2 out of 11 patents)

5.  Walter L Sass (2 out of 9 patents)

6.  Louis Manfredi (2 out of 9 patents)

7.  Michael Joseph Jobin (2 out of 24 patents)

8.  Amitabh Nag (1 out of 1 patent)

9.  Kevin Petty (1 out of 1 patent)

10.  Haiming Tan (1 out of 1 patent)

11.  Cosima Jackson (1 out of 1 patent)

12.  Jason Selzler (1 out of 1 patent)

13.  Sergey Panov (1 out of 1 patent)

14.  Chandrasekar Venkatchalam (1 out of 1 patent)

15.  Andrew Hastings-Black (1 out of 1 patent)


14 patents:

Company Overview
Vaisala, Inc. is a global leader in environmental and industrial measurement solutions, specializing in the development and manufacturing of instruments and systems for various applications. The company focuses on areas such as weather observation, environmental monitoring, and industrial process control, providing critical data for sectors including agriculture, pharmaceuticals, and transportation. Headquartered in Louisville, Colorado, Vaisala leverages advanced technology to enhance decision-making and operational efficiency across diverse industries.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

Vaisala, Inc. USPTO Patent Assignee Logo
14 Patents

#23 in Louisville, CO

#457 in Colorado

#22,302 in US

#42,199 in the World

Louisville, CO (US)
Louisville, CO, United States of America
Forward Citations = 48

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Vaisala, Inc.. Retrieved from https://idiyas.com/company/vaisala

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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