Trademarks = 6

Forward Citations = 54

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4 inventors (with patents filed for the assignee):

Lars O Rosaen (7 out of 29 patents)

Peter Ellis Hackett (4 out of 13 patents)

Wesley Fowler (1 out of 1 patent)

4. Nils O Rosaen (1 out of 20 patents)

8 patents: Sort by Forward Citations

1. 11175086 - Venturi vacuum drawback assemblies and dual orifice venturi valve assemblies (2021-11-16),

2. D926942 - Flow control plate (2021-08-03),

3. 11035483 - Dual orifice venturi vacuum drawback assemblies having air breather check valve (2021-06-15),

4. 10641406 - Venturi vacuum drawback assemblies and dual orifice venturi valve assemblies (2020-05-05),

5. 4836021 - Fluid flow meter (1989-06-06),

6. 4619139 - Flow meter with displaceable flow rate indicator (1986-10-28),

7. 4569233 - Flow meter indicating device (1986-02-11),

8. 4388835 - Fluid flow meter (1983-06-21),

Company Overview

Universal Flow Monitors, Inc. is a leading manufacturer of flow measurement solutions for various industries. With over 40 years of experience, they offer a wide range of flow meters and flow monitoring technologies to meet the needs of their customers. Their products are known for their accuracy, reliability, and durability, making them a trusted choice for businesses around the world.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

8 Patents

#1 in Hazel Park, MI

#1,236 in Michigan

#35,924 in US

Hazel Park, MI, United States of America

Universal Flow Monitors, Inc.

Forward Citations = 54

4 inventors:

Lars O Rosaen (7 out of 29 patents)

Peter Ellis Hackett (4 out of 13 patents)

Wesley Fowler (1 out of 1 patent)

4. Nils O Rosaen (1 out of 20 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Universal Flow Monitors, Inc.. Retrieved from https://idiyas.com/company/universal-flow-monitors

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]