Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
10 Patents
#12 in Latham, NY
#1,747 in New York
#29,892 in US
#56,119 in the World
Underground Imaging Technologies, Inc.
Forward Citations = 99
10 inventors:
Latham, NY, United States of America
Underground Imaging Technologies, Inc.
Calculating rank
% Expired Patents = 50.0
EPO Patents = 1
Forward Citations = 99
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10 inventors (with patents filed for the assignee):
Ross Jones (4 out of 34 patents)
Peter John Kelly (4 out of 15 patents)
Gary Neal Young (3 out of 9 patents)
4. Keith Sjostrom (2 out of 4 patents)
5. David Hanson (2 out of 14 patents)
6. Mark Wallbom (2 out of 2 patents)
7. David Whittemore (2 out of 2 patents)
8. Peter Allen Krumhansl (2 out of 6 patents)
9. Kevin L Alft (1 out of 20 patents)
10. Kenneth J Ryerson (1 out of 2 patents)
10 patents:
1. 9646415 - System and method for visualizing multiple-sensor subsurface imaging data (2017-05-09),
Company Overview
Underground Imaging Technologies, Inc. is a specialized firm based in Latham, NY, focusing on advanced subsurface imaging solutions. The company develops innovative technologies that enhance the detection and analysis of underground structures, utilities, and geological features. Its expertise spans various sectors, including construction, environmental assessment, and infrastructure management, providing critical insights that support safe and efficient project execution. The organization is committed to advancing imaging methodologies to meet the evolving needs of its clients.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Underground Imaging Technologies, Inc.. Retrieved from https://idiyas.com/company/underground-imaging-technologies
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]