Amherst, NY, United States of America

Ultra-Scan Corporation


USPTO Granted Patents = 39

% Expired Patents = 30.8

Trademarks = 1

Forward Citations = 1,077

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21 inventors (with patents filed for the assignee):

goldMedal John Keith Schneider (37 out of 117 patents)

silverMedal Jack Conway Kitchens (21 out of 53 patents)

bronzeMedal Stephen M Gojevic (11 out of 11 patents)

4.  Fred W Kiefer (8 out of 8 patents)

5.  James T Baker (6 out of 9 patents)

6.  Andrew D Vassallo (3 out of 3 patents)

7.  Gerald F Marshall (3 out of 3 patents)

8.  Leonard Pratt (2 out of 3 patents)

9.  Igor Shmelkin (2 out of 4 patents)

10.  William E Glenn (2 out of 60 patents)

11.  Frank W Keeney (2 out of 3 patents)

12.  Frederick W Kiefer (1 out of 4 patents)

13.  Fedir Venikov (1 out of 1 patent)

14.  Michael Amalfi (1 out of 1 patent)

15.  Bryan Schutjer (1 out of 1 patent)


Core Competencies:
Ultrasonic Area Array
Biometric Sensor
Multimodal Fusion
Hand Scanner
Acoustic Waveguide
Fingerprint Scanning
Clinical Research
Biometric Authentication
Imaging Device
Hydrophone Array

39 patents:

Company Overview
Ultra-Scan Corporation, based in Amherst, NY, specializes in advanced imaging and scanning technologies. The company focuses on developing innovative solutions for various applications, including security, industrial inspection, and medical diagnostics. With a commitment to enhancing imaging capabilities, Ultra-Scan integrates cutting-edge research in optics and software to deliver high-quality products that meet the evolving needs of its clients. Its expertise positions the company as a key player in the imaging technology sector.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

39 Patents

#1 in Amherst, NY

#541 in New York

#8,814 in US

#17,428 in the World

Amherst, NY (US)
Amherst, NY, United States of America
Forward Citations = 1,077

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ultra-Scan Corporation. Retrieved from https://idiyas.com/company/ultra-scan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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