Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
10 Patents
#3 in Worthington, OH
#1,231 in Ohio
#29,866 in US
#56,047 in the World
Toledo Scale Corporation
Forward Citations = 254
17 inventors:
Worthington, OH, United States of America
Toledo Scale Corporation
Trademarks = 1
Forward Citations = 254
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17 inventors (with patents filed for the assignee):
Neil C Griffen (3 out of 22 patents)
Nigel G Mills (2 out of 5 patents)
Richard C Loshbough (2 out of 13 patents)
4. David L Latimer (1 out of 6 patents)
5. Howard H Nojiri (1 out of 7 patents)
6. James F Million (1 out of 4 patents)
7. Michael N Hamilton (1 out of 1 patent)
8. Edwin J Stolz (1 out of 1 patent)
9. Larry C Heckendorn (1 out of 2 patents)
10. Curtis W Long (1 out of 1 patent)
11. Richard T Smigel (1 out of 1 patent)
12. Ronald J Gaines (1 out of 1 patent)
13. Benny N Dillon (1 out of 7 patents)
14. Mark E Weihs (1 out of 4 patents)
15. Donivan L Hall (1 out of 4 patents)
10 patents:
Company Overview
Toledo Scale Corporation, based in Worthington, Ohio, specializes in the design and manufacturing of precision weighing systems and equipment. The company is recognized for its innovative solutions in industrial weighing, providing products that cater to various sectors including manufacturing, logistics, and food processing. With a strong emphasis on accuracy and reliability, Toledo Scale Corporation continues to advance its technology to meet the evolving needs of its clients, ensuring optimal performance in weight measurement applications.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Toledo Scale Corporation. Retrieved from https://idiyas.com/company/toledo-scale
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]