Shaker Heights, OH, United States of America

Tip Imaging, LLC

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USPTO Granted Patents = 4

Forward Citations = 49

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5 inventors (with patents filed for the assignee):

David P Rohler (4 out of 10 patents)

Steven H Izen (4 out of 9 patents)

Thomas L Toth (4 out of 107 patents)

4. Arjun K Maniyedath (4 out of 9 patents)

5. Thomas E Dechant (1 out of 2 patents)

4 patents: Sort by Forward Citations

1. 11957501 - Methods and apparatus for extended low contrast detectability for radiographic imaging systems (2024-04-16),

2. 11116471 - Methods and apparatus for extended low contrast detectability for radiographic imaging systems (2021-09-14),

3. 9681851 - Methods and apparatus for extended low contrast detectability for radiographic imaging systems (2017-06-20),

4. 8891849 - Extended low contrast detectability for radiographic imaging systems (2014-11-18),

Company Overview

Tip Imaging, LLC provides innovative imaging solutions for medical professionals and facilities. With a focus on quality and efficiency, they offer a range of services including diagnostic imaging, teleradiology, and PACS solutions. Their team of experienced radiologists and technologists ensure accurate and timely results to improve patient care.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

4 Patents

#3 in Shaker Heights, OH

#2,337 in Ohio

#60,704 in US

Shaker Heights, OH, United States of America

Tip Imaging, LLC

Forward Citations = 49

5 inventors:

David P Rohler (4 out of 10 patents)

Steven H Izen (4 out of 9 patents)

Thomas L Toth (4 out of 107 patents)

4. Arjun K Maniyedath (4 out of 9 patents)

5. Thomas E Dechant (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Tip Imaging, LLC. Retrieved from https://idiyas.com/company/tip-imaging

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]