CIPO Patents = 1

Forward Citations = 213

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9 inventors (with patents filed for the assignee):

Darryl J Bornhop (1 out of 4 patents)

Bruce J McIntosh (1 out of 2 patents)

Peter A Coxon (1 out of 1 patent)

4. David Charles Poole (1 out of 1 patent)

5. Chafagat Fakhrazovitch Takhaoutdinov (1 out of 1 patent)

6. Alain Louis Loppinet (1 out of 1 patent)

7. Alexander J Paterson (1 out of 1 patent)

8. Serguey Anatolievitch Iakovlev (1 out of 1 patent)

9. Anatoly Yossifovitch Lipert (1 out of 1 patent)

10. Neil Bradshaw (2 patents)

11. Alan Lyle Gray (1 patent)

12. Neil Edward Sanderson (0 patent)

4 patents: Sort by Forward Citations

1. 5976263 - Sources used in molecular beam epitaxy (1999-11-02),

2. 5865247 - Cellulose injection system and method (1999-02-02),

3. 5665967 - Apparatus and method for surface analysis (1997-09-09),

4. 5325170 - Laser-based refractive index detector using backscatter (1994-06-28),

Company Overview

Thermo Instrument Systems Inc. specializes in manufacturing high-quality analytical instruments for industries such as pharmaceutical, environmental, and food safety. With a focus on cutting-edge technology and precision engineering, Thermo Instrument Systems Inc. is a trusted provider of accurate and reliable measurement solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

4 Patents

#18 in Santa Fe, NM

#163 in New Mexico

#60,597 in US

Santa Fe, NM, United States of America

Thermo Instrument Systems Inc.

Forward Citations = 213

9 inventors:

Darryl J Bornhop (1 out of 4 patents)

Bruce J McIntosh (1 out of 2 patents)

Peter A Coxon (1 out of 1 patent)

4. David Charles Poole (1 out of 1 patent)

5. Chafagat Fakhrazovitch Takhaoutdinov (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Thermo Instrument Systems Inc.. Retrieved from https://idiyas.com/company/thermo-instrument-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]