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USPTO Data Jan 1 1976 - Oct 13 2026
24 Patents
#2 in Commack, NY
#826 in New York
#13,884 in US
#26,660 in the World
Terk Technologies Corporation
Forward Citations = 483
19 inventors:
Commack, NY, United States of America
Terk Technologies Corporation
Forward Citations = 483
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19 inventors (with patents filed for the assignee):
Luc Heiligenstein (11 out of 53 patents)
Stephen Melamed (11 out of 54 patents)
Neil D Terk (9 out of 11 patents)
4. Sabrina L Tongish (4 out of 5 patents)
5. Michael Pelland (3 out of 11 patents)
6. Peter Langmar (3 out of 7 patents)
7. John A Lofgren (2 out of 6 patents)
8. George Skahill (2 out of 6 patents)
9. William R Steinike (2 out of 5 patents)
10. John Lonczak (1 out of 34 patents)
11. Matthew F Planning (1 out of 6 patents)
12. Jean-Jacques L′Henaff (1 out of 1 patent)
13. William H Cowles (1 out of 1 patent)
14. Nicholas G Paraskevopoulos (1 out of 1 patent)
15. Nina Krikorian (1 out of 1 patent)
24 patents:
Company Overview
Terk Technologies Corporation, based in Commack, NY, specializes in the development and manufacturing of innovative antenna solutions and related technologies. The company focuses on enhancing the reception of over-the-air television signals, providing consumers with high-quality broadcasting options. Terk is recognized for its commitment to research and development in the field of wireless communication, aiming to improve connectivity and user experience in various environments.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Terk Technologies Corporation. Retrieved from https://idiyas.com/company/terk-technologies
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]