EPO Patents = 2

Trademarks = 1

Forward Citations = 9

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3 inventors (with patents filed for the assignee):

Sabatino Nacson (6 out of 19 patents)

Aleksandar Crnatovic (2 out of 2 patents)

George Wiseman (2 out of 2 patents)

4. Aleksandar Cmatovic (0 patent)

6 patents: Sort by Forward Citations

1. 10883964 - Polarization dielectric discharge source for IMS instrument (2021-01-05),

2. 9541525 - Substances detection system and method (2017-01-10),

3. 9329156 - Aircraft screening device and method (2016-05-03),

4. 9170232 - Substances detection system and method (2015-10-27),

5. 9063100 - Transportable portal for detection of illicit substances (2015-06-23),

6. 8220312 - Non-invasive method and system for screening the content of containers for the presence of threat substances (2012-07-17),

Company Overview

Teknoscan Systems Inc is a leading provider of advanced imaging and security solutions. With a focus on innovation and customer satisfaction, we offer a range of products and services including x-ray scanners, metal detectors, and software solutions for various industries. Our team of experts is dedicated to delivering high-quality products and exceptional support to our clients worldwide.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

6 Patents

#11 in Vaughan

#2,416 in Canada

Vaughan, Canada

Teknoscan Systems Inc

Forward Citations = 9

3 inventors:

Sabatino Nacson (6 out of 19 patents)

Aleksandar Crnatovic (2 out of 2 patents)

George Wiseman (2 out of 2 patents)

4. Aleksandar Cmatovic (0 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Teknoscan Systems Inc. Retrieved from https://idiyas.com/company/teknoscan-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]