% Expired Patents = 25.0

CIPO Patents = 1

EPO Patents = 1

Trademarks = 24

Forward Citations = 5

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6 inventors (with patents filed for the assignee):

Stephen W Nabity (4 out of 6 patents)

Peter A Kaltenbach (1 out of 23 patents)

Lynn Gibney (1 out of 1 patent)

4. Andrea Ronning (1 out of 1 patent)

5. Henric Jentz (1 out of 22 patents)

6. Bryan D Hunter (1 out of 9 patents)

4 patents: Sort by Forward Citations

1. 11077577 - System, method and apparatus for producing a quilt block on a single die (2021-08-03),

2. 10828795 - Multi-die cut with common axis (2020-11-10),

3. 10603809 - Die cut with common blades (2020-03-31),

4. 8950320 - Portable roller press (2015-02-10),

Company Overview

Tek Industries, Inc. is a leading technology company, specializing in providing innovative solutions for various industries. With a focus on cutting-edge technology and exceptional customer service, we have established ourselves as a trusted partner for clients worldwide. Our diverse portfolio includes products and services in areas such as IT infrastructure, automation, and software development. Contact us today to learn more about how Tek Industries can help drive your business forward.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

4 Patents

#76 in Omaha, NE

#165 in Nebraska

#60,641 in US

Omaha, NE, United States of America

Tek Industries, Inc.

Forward Citations = 5

6 inventors:

Stephen W Nabity (4 out of 6 patents)

Peter A Kaltenbach (1 out of 23 patents)

Lynn Gibney (1 out of 1 patent)

4. Andrea Ronning (1 out of 1 patent)

5. Henric Jentz (1 out of 22 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Tek Industries, Inc.. Retrieved from https://idiyas.com/company/tek-industries

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]