Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
5 Patents
#42 in Tampere
#533 in Finland
Tamfelt Pmc Oy
Forward Citations = 8
14 inventors:
Tamfelt Pmc Oy
% Expired Patents = 80.0
CIPO Patents = 2
Forward Citations = 8
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14 inventors (with patents filed for the assignee):
Pekka Kortelainen (2 out of 5 patents)
Mari Seppanen (2 out of 2 patents)
Ali Harlin (1 out of 38 patents)
4. Rauno Enqvist (1 out of 8 patents)
5. Satu Hagfors (1 out of 5 patents)
6. Ville Lahdensuo (1 out of 1 patent)
7. Olli Jermo (1 out of 2 patents)
8. Marita A Leppimaki, Legal Representative (1 out of 1 patent)
9. Hannu Martikainen (1 out of 1 patent)
10. Tania Rautio (1 out of 4 patents)
11. Tuula Wilenius-Jaakonaho (1 out of 1 patent)
12. Seppo Taipale (1 out of 11 patents)
13. Terttu Turpeinen (1 out of 5 patents)
14. Aira Liitola (1 out of 1 patent)
15. Leena Silakoski (1 patent)
5 patents:
Company Overview
Tamfelt Pmc Oy is a Finnish company specializing in process industry solutions, including filtration products, fabric filters, and sealing solutions. With over 100 years of experience, Tamfelt Pmc Oy is known for its high-quality products and superior customer service.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Tamfelt Pmc Oy. Retrieved from https://idiyas.com/company/tamfelt-pmc-oy
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
2 patents (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]