Forward Citations = 147

Loading Chart...

5 inventors (with patents filed for the assignee):

Pradeep R Tripathi (3 out of 5 patents)

Bruce R Kohn (3 out of 7 patents)

Lothar Geilen (2 out of 4 patents)

4. Eugene J Tierney (1 out of 1 patent)

5. Lee M Clark (1 out of 3 patents)

6 patents: Sort by Forward Citations

1. 8666588 - Fraud detection in an OBD inspection system (2014-03-04),

2. 8428814 - Method of verifying regulatory compliance of a vehicle having a vehicle diagnostic system (2013-04-23),

3. 8190279 - Production line management system (2012-05-29),

4. 7596435 - Vehicle communication system and method with mobile data collection (2009-09-29),

5. 7347082 - Method and apparatus for testing vehicle fuel system integrity (2008-03-25),

6. 6836708 - Monitoring of vehicle health based on historical information (2004-12-28),

Company Overview

Systech International, LLC is a global technology company that provides packaging execution solutions for pharmaceutical, medical devices, food and beverage, and other industries. Their software and hardware products help companies ensure product safety, security, and authenticity throughout the supply chain. With over 30 years of experience, Systech is a leader in serialization, track and trace, and anti-counterfeiting solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

6 Patents

#5 in Murray, UT

#573 in Utah

#44,981 in US

Murray, UT, United States of America

Systech International, LLC

Forward Citations = 147

5 inventors:

Pradeep R Tripathi (3 out of 5 patents)

Bruce R Kohn (3 out of 7 patents)

Lothar Geilen (2 out of 4 patents)

4. Eugene J Tierney (1 out of 1 patent)

5. Lee M Clark (1 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Systech International, LLC. Retrieved from https://idiyas.com/company/systech-international

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]