Company Badge
USPTO Data Jan 1 1976 - Oct 6 2026
14 Patents
#3 in Pampa, TX
#1,378 in Texas
#22,302 in US
#42,199 in the World
Swm International Inc.
Forward Citations = 149
9 inventors:
Pampa, TX, United States of America
Swm International Inc.
Trademarks = 7
Forward Citations = 149
Loading Chart...
Loading Chart...
9 inventors (with patents filed for the assignee):
Dawna Mauldin (8 out of 8 patents)
Sidney Wayne Mauldin (7 out of 8 patents)
Dan Salkhai Ang (6 out of 6 patents)
4. David Christopher Parks (5 out of 21 patents)
5. Terrell Cray Saltarelli (2 out of 2 patents)
6. Keith Roper (1 out of 2 patents)
7. Ronald Haasl (1 out of 1 patent)
8. Leslie Alan Thomas (1 out of 1 patent)
9. Keith Nemez (1 out of 1 patent)
14 patents:
5. 12291946 - Downhole perforating gun system and methods of manufacture, assembly and use (2025-05-06),
Company Overview
Swm International Inc. is a leading provider of advanced materials and engineered solutions, specializing in the development and manufacturing of high-performance products for various industries. The company focuses on innovative applications in areas such as filtration, packaging, and specialty materials, catering to diverse markets including automotive, medical, and consumer goods. With a strong emphasis on research and technology, Swm International is committed to delivering cutting-edge solutions that meet the evolving needs of its global clientele.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Swm International Inc.. Retrieved from https://idiyas.com/company/swm-international
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]